NSN 6625-00-112-4304
Part Details | TEST PROBE-LEAD ASSEMBLY
6625-00-112-4304 A definite length of wire or cable with a CLIP, ELECTRICAL; CONNECTOR, PLUG, ELECTRICAL; CONNECTOR, RECEPTACLE, ELECTRICAL; JACK, TELEPHONE; JACK, TIP; PLUG, TIP; or the like on one or both ends and PROBE, TEST on either end but not on both ends. Electronic components, such as capacitors, electron tube, resistors, semiconductor devices, and the like are mounted into and included with the item for attenuation or amplification purposes. May or may not include accessories such as CLIP, ELECTRICAL; PROBE, TEST; TEST PROBE ATTACHMENT. For items without electronic components see, LEAD, TEST. For items designed for direct attachment to a PROBE-LEAD ASSEMBLY, TEST see PROBE, TEST. For items designed for indirect attachment to a PROBE-LEAD ASSEMBLY, TEST see TEST PROBE ATTACHMENT.
Alternate Parts: AV5337, AV-5337, AV533, AV-533, 49103, 4910-3, 010015200, 010-0152-00, P6007 OPT 03, 6625-00-112-4304, 00-112-4304, 6625001124304, 001124304
Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
---|---|---|---|
66 | DEC 24, 1972 | 00-112-4304 | 39884 ( PROBE-LEAD ASSEMBLY, TEST ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-00-112-4304
Part Number | Cage Code | Manufacturer |
---|---|---|
AV-5337 | 58414 | AVEX ELECTRONICS CORP. |
AV-533 | 58414 | AVEX ELECTRONICS CORP. |
4910-3 | 62381 | PROBE MASTER, INC. |
010-0152-00 | 80009 | TEKTRONIX, INC.DBA TEKTRONIX |
P6007 OPT 03 | 80009 | TEKTRONIX, INC.DBA TEKTRONIX |
Technical Data | NSN 6625-00-112-4304
Characteristic | Specifications |
---|---|
GENERAL CHARACTERISTICS ITEM DESCRIPTION | PLASTIC HANDLE; 108 IN. LG; 10 MEGO I/P RES; 2.4 PF I/P CAP; 25 MHZ BANDWIDTH; 1500 VDC MAX I/P; 100 TO 1 ATTENUATION; 14 NSEC RISE TIME; 3 PCT ACCURACY; 1 RETRACTABLE HOOK TIP; 1 BANANA TIP; 1 5 IN. AND 1 12 IN. LG GND LEAD; 1 STRAIGHT TIP; 1 SPRING TIP; 1 HOOK TIP; 2 MINIATURE ALLIGATOR CLIP; 1 PROD HOLDER; 1 INSTRUCTION MANUAL |
FSC APPLICATION DATA | ELECTRICAL,ELECTRONIC PROPERTIES MEASURING AND TEST INSTRUMENTS |