NSN 6625-00-100-8976

Part Details | SEMICONDUCTOR DEVICE TEST SET

6625-00-100-8976 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

Alternate Parts: TF151, 6625-00-100-8976, 00-100-8976, 6625001008976, 001008976

Supply Group (FSG) NSN Assigned NIIN Item Name Code (INC)
66DEC 15, 197200-100-897625006 ( TEST SET, SEMICONDUCTOR DEVICE )
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-00-100-8976
Part Number Cage Code Manufacturer
TF15133347SENCORE, INC.
Technical Data | NSN 6625-00-100-8976
Characteristic Specifications
TEST TYPE FOR WHICH DESIGNEDBETA GAIN;FIELD EFFECT
OPERATING TEST CAPABILITYTRANSISTOR BI-POLAR TESTING BETA RANGE FROM LOW POWER OF 1 TO HIGH POWER OF 500 AND FIELD EFFECT TRANSISTOR MUTUAL CONDUCTANCE RANGE FROM 0 TO 50000 MICROMHOS
AC VOLTAGE RATINGB110.0 VOLTS AND C130.0 VOLTS
FREQUENCY RATINGB50.0 HERTZ AND C60.0 HERTZ
PHASE SINGLE
INCLOSURE FEATURE SINGLE ITEM W/HOUSING
DEPTH6.000 INCHES NOMINAL
HEIGHT9.500 INCHES NOMINAL
WIDTH7.500 INCHES NOMINAL