NSN 6625-00-100-8976
Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-00-100-8976 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: TF151, 6625-00-100-8976, 00-100-8976, 6625001008976, 001008976
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | DEC 15, 1972 | 00-100-8976 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-00-100-8976
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| TF151 | 33347 | SENCORE, INC. |
Technical Data | NSN 6625-00-100-8976
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | BETA GAIN;FIELD EFFECT |
| OPERATING TEST CAPABILITY | TRANSISTOR BI-POLAR TESTING BETA RANGE FROM LOW POWER OF 1 TO HIGH POWER OF 500 AND FIELD EFFECT TRANSISTOR MUTUAL CONDUCTANCE RANGE FROM 0 TO 50000 MICROMHOS |
| AC VOLTAGE RATING | B110.0 VOLTS AND C130.0 VOLTS |
| FREQUENCY RATING | B50.0 HERTZ AND C60.0 HERTZ |
| PHASE | SINGLE |
| INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |
| DEPTH | 6.000 INCHES NOMINAL |
| HEIGHT | 9.500 INCHES NOMINAL |
| WIDTH | 7.500 INCHES NOMINAL |