NSN 6625-00-087-2973
Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-00-087-2973 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: 851, 6625-00-087-2973, 00-087-2973, 6625000872973, 000872973
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | APR 20, 1967 | 00-087-2973 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-00-087-2973
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| 851 | 20747 | L-3 COMMUNICATIONS CORPORATIONDBA GLOBAL NETWORK SOLUTIONS DIV |
Technical Data | NSN 6625-00-087-2973
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | IN-CIRCUIT TESTING OF COMPONENTS |
| ELECTRICAL POWER SOURCE RELATIONSHIP | OPERATING |
| AC VOLTAGE RATING | A115.0 VOLTS |
| FREQUENCY RATING | A60.0 HERTZ |
| PHASE | SINGLE |
| INCLOSURE FEATURE | SINGLE ITEM W/HOUSING |
| DEPTH | 286.0 MILLIMETERS NOMINAL |
| HEIGHT | 86.0 MILLIMETERS NOMINAL |
| WIDTH | 250.0 MILLIMETERS NOMINAL |
| END ITEM IDENTIFICATION | NSN 5826-00-117-7747 CALIBRATION BENCH MOCK UP |
| REFERENCE DATA AND LITERATURE | TO 33A1-15-55-4 |