NSN 6625-00-081-3672
Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-00-081-3672 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: 870, TS3365U, TS-3365/U, 6625-00-081-3672, 00-081-3672, 6625000813672, 000813672
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | JAN 01, 1963 | 00-081-3672 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-00-081-3672
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| 870 | 28569 | HICKOK INCORPORATED |
| TS-3365/U | 80058 | JOINT ELECTRONICS TYPE DESIGNATIONSYSTEM |
Technical Data | NSN 6625-00-081-3672
| Characteristic | Specifications |
|---|---|
| TEST TYPE FOR WHICH DESIGNED | MEASUREMENT OF VOLTAGE AND CURRENT |
| INCLOSURE FEATURE | SINGLE ITEM W/CARRYING CASE |
| MATERIAL AND LOCATION | ALUMINUM CARRYING CASE |
| HEIGHT | 7.870 INCHES NOMINAL |
| LENGTH | 14.500 INCHES NOMINAL |
| WIDTH | 11.700 INCHES NOMINAL |
| FSC APPLICATION DATA | TEST SET,TRANSISTOR,EXCEPT SPECIALLY DESIGNED |