NSN 6625-00-003-7026
Part Details | SEMICONDUCTOR DEVICE TEST SET
6625-00-003-7026 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Alternate Parts: 181512, 6625-00-003-7026, 00-003-7026, 6625000037026, 000037026
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | MAY 19, 1972 | 00-003-7026 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 6625-00-003-7026
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| 181512 | 18338 | XEROX CORPXEROX DOCUMENTATION AND SOFTWARE |
Technical Data | NSN 6625-00-003-7026
| Characteristic | Specifications |
|---|---|
| FUNCTIONAL DESCRIPTION | USED TO TEST AN/FPS79, 80, 496L OPERATION SITE |