NSN 4935-01-185-6486
Part Details | GUIDED MISSILE TEST STATION
4935-01-185-6486 A complete test station specifically designed to perform all electronic and/or hydraulic testing of a guided missile. Excludes TEST STATION, GUIDED MISSILE, SEMITRAILER MOUNTED; and TEST STATION, GUIDED MISSILE, TRUCK MOUNTED.
Alternate Parts: 2638804, ATSE35, ATS-E35, ATSE35E, ATS-E35E, ATSE35E, ATS-E35E, 40730147, 407-30147, 4935-01-185-6486, 01-185-6486, 4935011856486, 011856486
| Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 49 | AUG 01, 1984 | 01-185-6486 | 61504 ( TEST STATION, GUIDED MISSILE ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 4935-01-185-6486
| Part Number | Cage Code | Manufacturer |
|---|---|---|
| 2638804 | 06424 | ALLIANT TECHSYSTEMS OPERATIONS LLCDIV DEFENSE ELECTRONIC SYSTEMS |
| ATS-E35 | 28480 | HEWLETT-PACKARD COMPANYDBA HP |
| ATS-E35E | 28480 | HEWLETT-PACKARD COMPANYDBA HP |
| ATS-E35E | 1LQK8 | KEYSIGHT TECHNOLOGIES, INC. |
| 407-30147 | 81205 | THE BOEING COMPANYDBA BOEING |
Technical Data | NSN 4935-01-185-6486
| Characteristic | Specifications |
|---|---|
| END ITEM IDENTIFICATION | LGM30/LGM118A |
| SPECIAL FEATURES | 1 SYSTEM PROCESS OR W/MIN MEMORY OF 1.5 MEG; 2 DISC DRIVE UNITS W/MIN CAPACITY OF 132 MEG; 1 SYSTEM GRAPHICS TERMINAL; 1 PROG O SCOPE/DIGITIZER UNIT; 1 MULTI-PROGRAMMER; 1 SWITCH REGISTER PANEL; 1 LINE PRINTER; 1 MAG TAPE DRIVE; 2 SYNTHESIZER/FUNCTION GEN; 2 PROGRAMMABLE PULSE GEN; 1 RF SIGNAL GEN; 1 DIGITAL VOLTMETER; 1 UNIVERSAL COUNTER; 1 TIME INTERVAL PROBE; 1 RF SPECTRUM ANALYZER; 8 PROG DC PWR SUPPLIES; 1 SWITCH CONTROLLER; 1 MODULAR SWITCH ASSY; 1 VHF SWITCH ASSY; 1 TEST PWR INTERRUPT UNIT; 3 60.0 HZ PWR DIST UNITS; 1 400.0 HZ PWR DIST UNIT; 3 DIGITAL PATTERN GENERQTORS; 4DIGITAL DRIVER/RECEIVER SUBSYSTEM; 115.0/208.0 VAC, 60.0/400.0 HZ., 3-PHASE; 7000.0 LBS; 200.000 IN. L., 36.000 IN. W., 75.000 IN. H. |
| FUNCTIONAL DESCRIPTION | DESIGNED TO OPERATE AS AN INTERMEDIATE AND DEPOT LEVEL STATION C/O 6 BAYS OF DIGITAL, ANALOG, AND RF TEST EQUIPMENT, 2 BAYS OF COMPUTER EQUIPMENT AND EXTERNAL COMPUTER PERIPHERALS |